Catalogue of Tools & Metrics for Trustworthy AI

These tools and metrics are designed to help AI actors develop and use trustworthy AI systems and applications that respect human rights and are fair, transparent, explainable, robust, secure and safe.

Weak feature representation problem has influenced the performance of few-shot classification task for a long time. To alleviate this problem, recent researchers build connections between support and query instances through embedding patch features to generate discriminative representations. However, we observe that there exists semantic mismatches (foreground/ background) among these local patches, because the location and size of the target object are not fixed. What is worse, these mismatches result in unreliable similarity confidences, and complex dense connection exacerbates the problem. According to this, we propose a novel Clustered-patch Element Connection (CEC) layer to correct the mismatch problem. The CEC layer leverages Patch Cluster and Element Connection operations to collect and establish reliable connections with high similarity patch features, respectively. Moreover, we propose a CECNet, including CEC layer based attention module and distance metric. The former is utilized to generate a more discriminative representation benefiting from the global clustered-patch features, and the latter is introduced to reliably measure the similarity between pair-features. Extensive experiments demonstrate that our CECNet outperforms the state-of-the-art methods on classification benchmark. Furthermore, our CEC approach can be extended into few-shot segmentation and detection tasks, which achieves competitive performances.

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Disclaimer: The tools and metrics featured herein are solely those of the originating authors and are not vetted or endorsed by the OECD or its member countries. The Organisation cannot be held responsible for possible issues resulting from the posting of links to third parties' tools and metrics on this catalogue. More on the methodology can be found at https://oecd.ai/catalogue/faq.